Téléchargez le livre : CMOS RF Circuit Design for Reliability and Variability

CMOS RF Circuit Design for Reliability and Variability

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Éditeur :

Springer


Collection :

SpringerBriefs in Applied Sciences and Technology

Paru le : 2016-04-13

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Description
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Pages
106 pages
Collection
SpringerBriefs in Applied Sciences and Technology
Parution
2016-04-13
Marque
Springer
EAN papier
9789811008825
EAN EPUB
9789811008849
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
10
Taille du fichier
2437 Ko
Prix
52,74 €

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