Atomic Force Microscopy

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Éditeur :

Springer


Collection :

NanoScience and Technology

Paru le : 2019-05-23

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Description

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Pages
331 pages
Collection
NanoScience and Technology
Parution
2019-05-23
Marque
Springer
EAN papier
9783030136536
EAN PDF
9783030136543

Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
33
Taille du fichier
11141 Ko
Prix
158,24 €
EAN EPUB
9783030136543

Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
33
Taille du fichier
37171 Ko
Prix
158,24 €