Téléchargez le livre : Integrated Circuit Design for Radiation Environments

Integrated Circuit Design for Radiation Environments

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Éditeur :

Wiley


Paru le : 2019-12-03

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Description

A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits
This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips.
Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge
Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.
Pages
400 pages
Collection
n.c
Parution
2019-12-03
Marque
Wiley
EAN papier
9781119966340
EAN PDF
9781118701874
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
392
Taille du fichier
12483 Ko
Prix
122,33 €
EAN EPUB
9781118701850
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
400
Taille du fichier
19671 Ko
Prix
122,33 €

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