Defects in Self-Catalysed III-V Nanowires

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Éditeur :

Springer


Collection :

Springer Theses

Paru le : 2022-01-28

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Description
This thesis presents an in-depth exploration of imperfections that can be found in self-catalysed III-V semiconductor nanowires. By utilising advanced electron microscopy techniques, the interface sharpness and defects at the atomic and macroscopic scale are analysed. It is found that a surprising variety and quantity of defect structures can exist in nanowire systems, and that they can in fact host some never-before-seen defect configurations. To probe how these defects are formed, conditions during nanowire growth can be emulated inside the microscope using the latest generation of in-situ heating holder. This allowed the examination of defect formation, dynamics, and removal, revealing that many of the defects can in fact be eliminated. This information is critical for attaining perfect nanowire growth. The author presents annealing strategies to improve crystal quality, and therefore device performance.
Pages
143 pages
Collection
Springer Theses
Parution
2022-01-28
Marque
Springer
EAN papier
9783030940614
EAN PDF
9783030940621

Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
14
Taille du fichier
7741 Ko
Prix
158,24 €
EAN EPUB
9783030940621

Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
14
Taille du fichier
81971 Ko
Prix
158,24 €