Téléchargez le livre : Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology

Techniques and Applications de

,

Éditeur :

Springer


Paru le : 2007-03-09

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Description
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Pages
522 pages
Collection
n.c
Parution
2007-03-09
Marque
Springer
EAN papier
9780387333250
EAN PDF
9780387396200
Informations sur l'ebook
Nombre pages copiables
5
Nombre pages imprimables
52
Taille du fichier
114381 Ko
Prix
231,04 €

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