Microscopy Methods in Nanomaterials Characterization

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Elsevier Science


Paru le : 2017-05-17

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Description
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. - Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique - Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques - Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each
Pages
432 pages
Collection
n.c
Parution
2017-05-17
Marque
Elsevier Science
EAN papier
9780323461412
EAN PDF
9780323461474

Informations sur l'ebook
Nombre pages copiables
43
Nombre pages imprimables
43
Taille du fichier
9441 Ko
Prix
195,17 €
EAN EPUB SANS DRM
9780323461474

Informations sur l'ebook
Prix
195,17 €

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