Téléchargez le livre : Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization de

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Éditeur :

Springer


Collection :

Springer Series in Surface Sciences

Paru le : 2018-03-09

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Description

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.
In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.
It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Pages
521 pages
Collection
Springer Series in Surface Sciences
Parution
2018-03-09
Marque
Springer
EAN papier
9783319756868
EAN PDF
9783319756875
Informations sur l'ebook
Nombre pages copiables
5
Nombre pages imprimables
52
Taille du fichier
28426 Ko
Prix
220,49 €
EAN EPUB
9783319756875
Informations sur l'ebook
Nombre pages copiables
5
Nombre pages imprimables
52
Taille du fichier
21996 Ko
Prix
220,49 €

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