Téléchargez le livre : Interconnect Reliability in Advanced Memory Device Packaging

Interconnect Reliability in Advanced Memory Device Packaging

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Éditeur :

Springer


Collection :

Springer Series in Reliability Engineering

Paru le : 2023-04-28

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Description

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.
In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects.
This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.
Pages
210 pages
Collection
Springer Series in Reliability Engineering
Parution
2023-04-28
Marque
Springer
EAN papier
9783031267079
EAN PDF
9783031267086
Informations sur l'ebook
Nombre pages copiables
2
Nombre pages imprimables
21
Taille du fichier
9339 Ko
Prix
210,99 €
EAN EPUB
9783031267086
Informations sur l'ebook
Nombre pages copiables
2
Nombre pages imprimables
21
Taille du fichier
59116 Ko
Prix
210,99 €

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