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Télécharger le livre : Helium Ion Microscopy
David C. Joy
Helium Ion Microscopy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as theHelium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st...
Editeur : Springer
Parution : 2013-09-13
Collection : SpringerBriefs in Materials
Format(s) : ePub
52,74 €
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Télécharger le livre : Monte Carlo Modeling for Electron Microscopy and Microanalysis
David C. Joy
Monte Carlo Modeling for Electron Microscopy and Microanalysis
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a...
Editeur : Oxford University Press
Parution : 1995-04-13

Format(s) : PDF
131,43 €
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