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Télécharger le livre : Electromigration Modeling at Circuit Layout Level
Feifei He , Cher Ming Tan
Electromigration Modeling at Circuit Layout Level
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels....
Editeur : Springer
Parution : 2013-03-16
Collection : SpringerBriefs in Applied Sciences and Technology
Format(s) : ePub
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