Dr. Soumya Ranjan Nayak now holds the position of Assistant Professor in the School of Computer Engineering at Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, located in Odisha, India. He obtained a Doctor of Philosophy (Ph.D) and Master of Technology (M.Tech) in Computer Science and Engineering under a scholarship provided by the Ministry of Human Resource Development (MHRD) of the Government of India. These degrees were earned at CET, BPUT Rourkela, India. Prior to this, he completed a Bachelor of Technology (B. Tech) and a Diploma in Computer Science and Engineering. He has authored over 150 articles that have been published in reputable international journals and conferences such as Elsevier, Springer, World Scientific, IOS Press, Taylor & Francis, Hindawi, Inderscience, IGI Global, and others. These publications have undergone a rigorous peer-review process. In addition to the aforementioned accomplishments, the individual has authored 16 book chapters, published 6 books, and obtained 7 Indian patents (with 4 patents being granted). Furthermore, they have secured 4 International patents, all of which have been granted. The researcher's current areas of focus encompass medical picture analysis and classification, machine learning, deep learning, pattern recognition, fractal graphics, and computer vision. The author's writings have garnered over 1500 citations, with an h-index of 24 and an i10-index of 63, as reported by Google Scholar. Dr. Nayak holds the position of an associate editor for several esteemed academic journals, including the Journal of Electronic Imaging (SPIE), Mathematical Problems in Engineering (Hindawi), Journal of Biomedical Imaging (Hindawi), Applied Computational Intelligence and Soft Computing (Hindawi), and PLOS One. He is currently fulfilling the role of a guest editor for special issues of renowned academic journals such as Springer Nature, Elsevier, and Taylor & Franchise. He has been affiliated as a reviewer for numerous esteemed peer-reviewed journals, including Applied Mathematics and Computation, Journal of Applied Remote Sensing, Mathematical Problems in Engineering, International Journal of Light and Electron Optics, Journal of Intelligent and Fuzzy Systems, Future Generation Computer Systems, Pattern Recognition Letters, and others. He has additionally held the Technical Program Committee Member position for several conferences of significant worldwide recognition.